The MERLIN Compact VP

• Resolution: 0.8nm @ 15KV; 1.4nm @ 1 KV; 0.8nm @ 30KV (STEM mode)
• Probe current: 5 pA to 100nA
• Acceleration voltage: 0.02 V to 30 kV 
• Magnification: 12 – 2,00,000 X
• Electron Emitter:Thermal (Schottky) field emission gun.
• Detection Modes

1. In-lens Duo: Switchable between on-axis in-lens secondary electron detection for highest surface sensitivity and energy selective backscattered detection for advanced materials contrasts.
2. Secondary Ion: High efficiency in-lens SE detector Everhart Thornley Secondary Electron detector
3. Variable Pressure: High efficiency VPSE detector for pressure up to 60 Pa
4. STEM: Low voltage optimized bright field, 4 quadrant dark field, and high angular dark field transmission imaging.
5. EDAX for chemical composition analysis and element mapping.
6. Cryo SEM and freeze fracture for imaging hydrated samples or for beam/vacuum sensitive specimens.
7. Correlative Microscopy with Shuttle and Find.

• Specimen Stage: 5-Axes Motorized Eucentric Specimen Stage:X = 130mm; Y = 130mm; Z = 50mm; T = - 3º to 70º; R = 360º (continous)  
• Chamber:  330mm(Ø) x 270mm(h)                              15 accessory ports for various options including CCD-Camera with IR-illumination
• Vacuum system:  High vacuum mode and variable pressure mode